次の認定試験に速く合格する!
簡単に認定試験を準備し、学び、そして合格するためにすべてが必要だ。
(A)The costs for debugging are higher for a Si test environment than for a MiL test environment.
(B)As tests for MIL and SIL take place closer to the test object, the test basis must have a higher degree of detail than In HIL.
(C)To lest m a MIL test environment, a full system specification is necessary.
(D)The proximity to reality in a MiL test environment is higher than In a SI test environment
(A)Test case simulator, rest bus simulation, power supply
(B)Breakout box, Software-Compiler, real parts
(C)Power supply, real time capable computer electric error simulation
(D)Electric error simulation, signal processing, processor simulation
(A)The test report must describe the test process including the identification of menaces and dependencies from other processes.
(B)The test logs should be automated on all lest levels as much as possible to increase the comparability of the test results and reduce the effort for the lest execution.
(C)The test log must Include methods for test case creation. for the selection of test cases, for the creation of test data and for the lest execution
(D)In the regression testing strategy, methods must be defined for an impact analysis and the selection of appropriate test cases for regression testing
(A)For integration tests SiL Mil and HiL test environments are suitable
(B)The correct classification of the test levels has no died influence on the safety relevance of the test object (with regard to ISO 26262).
(C)For load and stress tests. MIL and HiL test environments are suitable
(D)For component tests, St and MiL test environments are suitable
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